InfraRed Spectroscopy
Controlling the chemical reactions that take place within materials, being able to probe their microstructure and to analyze the defect distribution they may host during their manufacturing or functioning, are key issues to evaluate the properties and performance of materials or processes. It is well known that the structure and properties of materials are mainly controlled by their morphology and composition which results from their response to local chemical and/or thermal gradients and/or mechanical stresses that take place. Furthermore, it is well known from thermodynamics that heat and mass transfers are coupled: thus, it is clear that being able to probe locally both species (amounts, concentrations) and temperature changes may shed light such coupled phenomena and provide a way to control and optimize them in view of targeted applications. Nevertheless, from the spectroscopic side, very few systems allow to perform a snapshot image of the concentration field inside heterogeneous samples. Most of them use scanning approaches to achieve cartography measurements. With our complete solution, it is easy to perform simultaneous tomographic measurements of temperature and concentration with high spatial resolution (up to 4×4 µm per pixel, for 256×320 pixels per image) and very high frame rate (up to 1 kHz in full frame). This offers today the possibility to measure multispectral and tomographic temperature and concentration fields, in less than 2 min, whereas classical spectrometer will take more than 24h.
|
Technical datasheet
IR range from 1 to 20 µm by 1 nm step High spatial resolution from 7 µm High frequency rate (up to 500 kHz) High sensitive even in Water Simultaneaous temperature and concentration measurements Scientific reference
|